Home Sensitivity and Uncertainty Analysis for UAM Pin-Cell Benchmark by McCARD
저자
S. M. Kang, H. J. Shim, L. C. Leal
저널 정보
Transactions of the Korean Nuclear Society Spring Meeting, Jeju, Korea, May 29-30 (2014)
출간연도
2014
구분
Conference(Domestic)
링크
https://www.kns.org/files/pre_paper/31/239%EB%B0%95%ED%98%B8%EC%A7%84.pdf
